JPS6142221B2 - - Google Patents

Info

Publication number
JPS6142221B2
JPS6142221B2 JP52142515A JP14251577A JPS6142221B2 JP S6142221 B2 JPS6142221 B2 JP S6142221B2 JP 52142515 A JP52142515 A JP 52142515A JP 14251577 A JP14251577 A JP 14251577A JP S6142221 B2 JPS6142221 B2 JP S6142221B2
Authority
JP
Japan
Prior art keywords
defect
defects
steel plate
light
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP52142515A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5474792A (en
Inventor
Takeshi Katayama
Kenichi Sakamoto
Tadao Kawaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP14251577A priority Critical patent/JPS5474792A/ja
Publication of JPS5474792A publication Critical patent/JPS5474792A/ja
Publication of JPS6142221B2 publication Critical patent/JPS6142221B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP14251577A 1977-11-28 1977-11-28 Surface defect inspection method of steel plates Granted JPS5474792A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14251577A JPS5474792A (en) 1977-11-28 1977-11-28 Surface defect inspection method of steel plates

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14251577A JPS5474792A (en) 1977-11-28 1977-11-28 Surface defect inspection method of steel plates

Publications (2)

Publication Number Publication Date
JPS5474792A JPS5474792A (en) 1979-06-15
JPS6142221B2 true JPS6142221B2 (en]) 1986-09-19

Family

ID=15317140

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14251577A Granted JPS5474792A (en) 1977-11-28 1977-11-28 Surface defect inspection method of steel plates

Country Status (1)

Country Link
JP (1) JPS5474792A (en])

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6314021U (en]) * 1986-07-14 1988-01-29
JPS6314019U (en]) * 1986-07-14 1988-01-29
JPS6314020U (en]) * 1986-07-14 1988-01-29
WO2024161619A1 (ja) * 2023-02-03 2024-08-08 Ｐｒｉｍｅｔａｌｓ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ｊａｐａｎ株式会社 疵検出装置、圧延装置、疵検出方法及び圧延方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5754844A (en) * 1980-09-19 1982-04-01 Nippon Steel Corp Flaw signal processing apparatus
DE69330010T2 (de) * 1992-05-29 2001-09-13 Eastman Kodak Co., Rochester Vorrichtung und Verfahren zur Beschichtungsdichteanalyse mittels Bildverarbeitung

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5611894B2 (en]) * 1973-09-26 1981-03-17
JPS5637499B2 (en]) * 1973-11-15 1981-09-01
US3944978A (en) * 1974-09-09 1976-03-16 Recognition Systems, Inc. Electro-optical method and apparatus for making identifications
JPS51145387A (en) * 1975-06-10 1976-12-14 Toshiba Corp Fault detecting device
JPS5952378B2 (ja) * 1976-01-28 1984-12-19 東洋紡績株式会社 シ−ト状物の欠点判別法

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6314021U (en]) * 1986-07-14 1988-01-29
JPS6314019U (en]) * 1986-07-14 1988-01-29
JPS6314020U (en]) * 1986-07-14 1988-01-29
WO2024161619A1 (ja) * 2023-02-03 2024-08-08 Ｐｒｉｍｅｔａｌｓ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ｊａｐａｎ株式会社 疵検出装置、圧延装置、疵検出方法及び圧延方法

Also Published As

Publication number Publication date
JPS5474792A (en) 1979-06-15

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